Project Overview:

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Objective:

Verification of a DDR4-based Chiplet memory subsystem.

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Components:

     DDR4 Memory Controller, DDRPHY with DFI-compliant interface, and Die-to-Die (D2D) interface.

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Value Proposition:

     Provides optimized high bandwidth, high reliability, and low power DDR4 access.         Enables quick SoC integration of memory subsystemsVerification

 

Strategy:

     Developed a UVM-based configurable testbench.Integrated Avery AHB UVC and DDR4 DIMM memory model.

     Created detailed test plan aligned with DDR4 JEDEC specs and DFI protocol.

     Supported verification of DFI interface and DDRPHY using RAL-based test suites.

 

Test Implementation and Results:

     Implemented key DDR4 test scenarios:

     Initialization, Training, Read/Write, Power-down, Self-refresh.

     Achieved 100% functional coverage on schedule.

     Enhanced debug with protocol checkers and transaction-level monitors.

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Highlights:

    Seamless integration of Avery VIP components.

    Robust, reusable testbench architecture.

    DFI and PHY compliance verified.

    On-time milestone achievement.

 

Outcome:

    Fully validated DDR4 Chiplet ready for SoC integration.

    Verification infrastructure reused for future memory subsystem projects.